CONTACT US
CONTACT YOUR LOCAL OFFICE
888-KEYENCE
(888-539-3623)
OR EMAIL US AT
VK-X 3D Laser Scanning Microscope
The VK-X Series 3D Laser Scanning Microscope expands the capabilities of laser microscopy. Combining features of an optical microscope, roughness gauge, laser profilometer, and scanning electron microscope, our laser scanning microscope performs non-contact surface profile, surface roughness, and thickness measurements without the need for sample preparation. By using a laser to scan across a target, this system can produce fully-focused images with incredibly high-resolution on nearly any type of material.Key Features
- Non-contact 2D & 3D Measurements
- Measure surface topography without damaging your samples
- 0.5 nm Z-axis Measurement Resolution
- High-resolution measurements on nearly any material
- Characterize Highly-Angular Surfaces
- Obtain accurate profile and roughness measurements on targets with irregular surfaces
- SEM-like Resolution & Depth of Field
- Fully-focused, color images
- Thickness Measurements
- Collect surface data from top and bottom layers of transparent material
- Zero Sample Preparation
- Just place your target on the microscope stage
- Easy Mode
- Measure a target with just a click of the mouse
- Macro & Stitching Programs
- Programmable XY stage for image stitching and automated measurements
Catalog Download
VK-X 3D Laser Scanning Microscope
Applications
Semiconductor
Aerospace
Material Science
Other
