Providing Non-contact Profile and Roughness Measurements on Nearly Any Material

VK-X 3D Laser Scanning Microscope

The VK-X Series 3D Laser Scanning Microscope expands the capabilities of laser microscopy. Combining features of an optical microscope, roughness gauge, laser profilometer, and scanning electron microscope, our laser scanning microscope performs non-contact surface profile, surface roughness, and thickness measurements without the need for sample preparation. By using a laser to scan across a target, this system can produce fully-focused images with incredibly high-resolution on nearly any type of material.

Key Features

Non-contact 2D & 3D Measurements

Non-contact 2D & 3D Measurements
Measure surface topography without damaging your samples

0.5 nm Z-axis Measurement Resolution

0.5 nm Z-axis Measurement Resolution
High-resolution measurements on nearly any material

Characterize Highly-Angular Surfaces

Characterize Highly-Angular Surfaces
Obtain accurate profile and roughness measurements on targets with irregular surfaces

SEM-like Resolution & Depth of Field

SEM-like Resolution & Depth of Field
Fully-focused, color images

Thickness Measurements

Thickness Measurements
Collect surface data from top and bottom layers of transparent material

Zero Sample Preparation

Zero Sample Preparation
Just place your target on the microscope stage

Easy Mode

Easy Mode
Measure a target with just a click of the mouse

Macro & Stitching Programs

Macro & Stitching Programs
Programmable XY stage for image stitching and automated measurements

Catalog Download

VK-X 3D Laser Scanning Microscope

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NEW Laser Microscope Video

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Applications

Semiconductor

Semiconductor

Material Science

Material Science
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New Technical Guide: Laser Scanning Microscopes vs. Interferometers [New] New Technical Guide: Laser Scanning Microscopes vs. Interferometers
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