0.5 nm Z-axis Measurement Resolution
Resolution is the key to higher precision measurement
0.5 nm linear scale
Industry Best
The newly-designed linear scale module of the VK-X Laser Scanning Microscope is able to detect Z-axis position information with 0.5 nm resolution, 20x greater than conventional laser microscopes. This high-precision scale improves the resolution for surface profiling and roughness measurements and can be traced back to national standards.
