Applications
Semiconductor / Electronic parts
Roughness measurement of rear face of a silicon wafer (3000x)
Surface area measurement of a solar battery (1000x)
Display
TFT height measurement (1000x)
Average height measurement of a spacer (3000x)
Precision / Chemical
Automatic width measurement of conductive paste (1000x)
Surface roughness measurement after plasma electrolytic oxidation processing (3000x)
Other
Hair roughness measurement (3000x; two connected images)
Film thickness measurement of cell phone case surface (1000x)
