VK-X SERIES

Overview

Non-contact 2D & 3D Measurements

Non-contact 2D & 3D Measurements

Measure surface topography without damaging your samples

0.5 nm Z-axis Measurement Resolution

0.5 nm Z-axis Measurement Resolution

High-resolution measurements on nearly any material

Characterize Highly-Angluar Surfaces

Characterize Highly-Angluar Surfaces

Obtain accurate profile and roughness measurements on targets with irregular surfaces

SEM-like Resolution & Depth of Field
Thickness Measurements

Thickness Measurements

Collect surface data from top and bottom layers of transparent material

Zero Sample Preparation

Zero Sample Preparation

Just place your target on the microscope stage

Easy Mode

Easy Mode

Perform measurements with a single click of the mouse

Macro & Stitching Programs

Macro & Image Stitching Programs

Programmable XY stage for image stitching and automated measurements

16-bit Photo Multiplier

High-sensitivity light receiving element gathers accurate measurement data

Real Peak Detection

Find the true measurement peak in less time

Optimized Texture Contrast

Easily observe low-contrast objects with improved clarity and color

Advanced Auto Gain

Automatically adjusts laser sensitivity depending on the object being observed

Removable Measuring Head

Measure large targets that are unable to fit on the microscope stage

Anti-vibration Design

Reduce the effects of environmental vibration without the need for an isolation table

High Numerical Aperture Lenses

A must-have for high-resolution images and larger detection angle

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