Product Concept

Combine the capabilities of an OPTICAL MICROSCOPE,
SEM, and ROUGHNESS GAUGE

Perform non-contact surface characterization and sub-micron roughness measurement with no sample preparation required.

The VK-X Series 3D Laser Scanning Microscope captures high-resolution images, comparable to an SEM, with nanometer-level measurements and the ease-of-use of an optical microscope.

With high-resolution color imaging and nanometer-level profile measurement functions, laser scanning microscopes overcome the inadequacies of conventional imaging and profiling technologies.